Advanced Machinery for Electronics Manufacturers | SEIKA Machinery, Inc.

HIOKI In-Circuit Testers

Key Features

Flying Probe ICT with AOI Functions
  • Evaluates solder joints between lands and leads by resistance testing
  • 40 steps/sec. measuring rate
  • AOI function checks component presence, polarity and displacement
  • Soft-landing probes to prevent board damage
  • Minimum probing pitch of 0.2mm
  • Fast fixture-less setup
  • Optional Tecnomatix Unicam CAD conversion software

1220 Bed-of-Nails (BON) In-Circuit Tester
  • High-speed and efficient in-circuit testing
  • Automatic Test Generation (ATG) function
  • Remote self-diagnostic feature
  • Data stored in CSV format for off-line analysis
  • Wide range measurement capabilities
  • Compact, space-saving footprint
  • User-friendly Windows® 2000/XP operation

1220 Benchtop Model
  • Flexible and cost-effective
  • Adaptable to third-party BON fixtures

Sakaya Demo Video Download Brochure