Advanced Machinery for Electronics Manufacturers | SEIKA Machinery, Inc.

Sayaka PCB Router (Depaneling System)

1220 IN-CIRCUIT HiTESTER

Key Features

  • Functions combined in one bench-top cabinet
  • In-circuit testing functions are assembled into a system or line to save space in the testing facility, enabling easy support of cell production.
  • Macro test
  • Includes the macro test, a high-performance capability for testing even with only a few measurement points (see page 3 for details)
  • High-speed test 1
  • Faster in-circuit testing is achieved by a new measurement board design
  • High-speed test 2
  • Optional board parallel testing greatly shortens test time.
    Remote self-diagnostics
    Self-diagnosis of Model 1220 can be initiated over the Internet, enabling remote maintenance support even at factories located overseas.
  • Compatibility
  • Test data from the HIOKI 1105 can be converted. Model 1101/1102 test data can be converted by the 1137-02 data generation software. Data conversion functions also support data from other companies.
  • System development
  • Because of its easy network confi guration, customers can operate the system as their requirements demand. Test data from multiple 1220s can be centrally managed by a server PC. Applications can be constructed to include operations such as capturing test history, statistical data and operating conditions of each machine.
  • Scanner boards
  • Two types of boards are available: scanner boards for speed, and relay boards for high power and precision. A variety of test functions are available to suit individual applications.
  • User interface
  • Communication with Windows-based PCs via LAN is available. Operation is easy in an environment familiar to everyone.
  • Strengthened data editing functions
  • Use these functions to develop and modify groups of test data such as for multi-cut boards or data managed in multiple files, by modifying only the necessary parts.
  • Statistical analysis
  • Data measured by Model 1220 can be saved to a PC's hard disk for each board tested. Data is stored in CSV format, which can be adapted to many applications.